参考リンク

・齋藤輝文のResarch Gateページ(一部ダウンロードサービスもあり)

著書

  1. T. Saito, “Spectral properties of semiconductor photodiodes”, Chapter 1 (pp. 3-24) in “Advances in photodiodes”(Intech, Croatia, March 2011) ISBN 978-953-307-163-3.
  2. 齋藤輝文, “検出器の測定”, 電子情報通信学会知識ベース「知識の森」12群6編4章4-1-5節 p. 8-9/(23) (2011).
  3. 齋藤輝文, “光の強さを定量的にはかる”, 産総研編”きちんとわかる計量標準”(白日社, 2007), 第10章, pp. 355-378.
  4. T. Saito, “Metrological applications” (Chapter 14) in “Undulators, wigglers and their applications” edited by H. Onuki and P. Elleaume (Taylor & Francis, London, 2003), pp. 421-434.

主な発表論文

  1. T. Saito, M. Tatsuta, Y. Abe and M. Takesawa, “Calorimetric Measurement for Internal Conversion Efficiency of Photovoltaic Cells/Modules Based on Electrical Substitution Method”, J. of Physics: Conf. Series 972 (2018) 012019; doi :10.1088/1742-6596/972/1/012019.
  2. 齋藤,阿部,酢谷,柴崎,武澤,初谷,渕脇,味原,宍戸,杉山, “屋根一体型太陽電池の通電加熱による除雪Ⅱ”, 東北工業大学地域連携センター紀要(EOS) 29 (1), 23-31 (2016).
  3. 齋藤,柴崎,武澤,初谷,渕脇,味原,宍戸,杉山, “屋根一体型太陽電池の通電加熱による除雪”, 東北工業大学地域連携センター紀要(EOS) 28 (1), 11-20 (2015).
  4. A. BenMoussa, B. Giordanengo, S. Gissot , I. E. Dammasch, M. Dominique, J.-F. Hochedez, A. Soltani, N. Bourzgui, T. Saito, U. Schühle, A. Gottwald, U. Kroth, A. R. Jones, “Degradation Assessment of LYRA after 5 Years on Orbit -Technology Demonstration –“, Exp. Astron. DOI 10.1007/s10686-014-9437-7 (2015).
  5. Y. Kubo, K.Fukui, K. Yamamoto, T.Saito and T. Horigome, “The Improvement and Evaluation of VIS-VUV Ellipsometry”, UVSOR Activity Report 2014, UVSOR-42, ISSN 0911-5730 (UVSOR, Okazaki, July 2015)p. 43.
  6. Samuel Gissot, Ali BenMoussa, Boris Giordanengo, Ali Soltani, Terubumi Saito, Udo Schühle, Udo Kroth, and Alexander Gottwald ,“Design and Radiation Hardness of Next Generation Solar UV Radiometers”, Proc. of IEEE NUCLEAR AND SPACE RADIATION EFFECTS (NSREC) CONFERENCE, Paris, France (2014).; Radiation Effects Data Workshop (REDW), 2014 IEEE, DOI:10.1109/REDW.2014.7004563
  7. T. Saito, K. Ozaki and K. Fukui, “Stokes Parameters Measured by VUV Spectral Ellipsometer”, UVSOR Activity Report 2013, UVSOR-41, ISSN 0911-5730 (UVSOR, Okazaki, July 2014)p. 40.
  8. J. Gardner, E. Woolliams, R. Baribeau, T. Bergen, A. Bialek, E. Carter, M. Cox, T. Goodman, U. Krueger, C. Li, S. Nevas, Y. Ohno, T. Saito, R. Young, Y. Zong, and J. Zwinkels, “Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities”, CIE Technical Reports and Guides 214:2014.
  9. T. Saito, K. Ozaki, K. Fukui, H. Iwai, K. Yamamoto, H. Miyake, K. Hiramatsu, “VUV Ellipsometer Using Inclined Detector as Analyzer to Measure Stokes Parameters and Optical Constants – With Results for AlN Optical Constants -“, Thin Solid Films 571, 517-521 (2014).
  10. A. BenMoussa, S. Gissot, B. Giordanengo, G. Meynants, X. Wang, B. Wolfs, J. Bogaerts, U. Schühle G. Berger, A. Gottwald, C. Laubis, U. Kroth , F. Scholze, A. Soltani and T. Saito, “Irradiation damage tests on backside-illuminated CMOS APS prototypes for the Extreme Ultraviolet Imager on-board Solar Orbiter”, IEEE TRANSACTIONS ON NUCLEAR SCIENCE 60 (5), 3907-3914 (2013).
  11. A. BenMoussa, A. Soltani, J-C Gerbedoen, T. Saito, S. Averin, S. Gissot, B. Giordanengo, G. Berger, U. Kroth, J-C. De Jaeger, A. Gottwald, “Developments, characterization and proton irradiation damage tests of AlN detectors for VUV Solar Observations”, Nucl. Instr. and Meth. in Phys. Res. B 312, 48-53 (2013).
  12. T. Saito, “Optical properties of semiconductor photodiodes/solar cells”, Metrologia 49 (2012) S118 -S123.
  13. Eppeldauer, G., Gardner, J., Goodman, T., Kaplan, S., Ohno, Y., Palmer, J., Saito, T., Sauter, G., Sperling, A., Winter, S., and Zong, Y., “Spectral Responsivity Measurement of Detectors, Radiometers and Photometers”, CIE 202:2011.
  14. T. Saito, H. Shitomi and I. Saito, “Angular dependence of photodetector responsivity”, Proc. of CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry , x036:2010, 141-146 (2010).
  15. T. Saito, T. Hitora, H. Ishihara, M. Matsuoka, H. Hitora, H. Kawai, I. Saito, and E. Yamaguchi, “Group III – Nitride Semiconductor Schottky Barrier Photodiodes for the Radiometric Use in the UV and VUV Regions”, Metrologia, 46, S272-S276 (2009).
  16. T. Saito, T. Hitora, H. Hitora, H. Kawai, I. Saito, and E. Yamaguchi, “UV/VUV Photodetectors using Group III – Nitride Semiconductors”, Phys Status Solidi, C 6, S658-S661 (2009).
  17. T. Saito, K. Hayashi, H. Ishihara and I. Saito, “Characterization of Photoconductive Diamond Detectors as a Candidate of FUV /VUV Transfer Standard Detectors”, Metrologia, 43, S51-S55 (2006).
  18. A. BenMoussa, U. Schuehle, F. Scholze, U. Kroth, K. Haenen, T. Saito, J. Campos, S. Koizumi, C. Laubis, M. Richter, V. Mortet, A. Theissen and J. F. Hochedez, “Radiometric characteristics of new diamond pin-photodiodes”, Meas. Sci. Technol. , 17, 913-917 (2006).
  19. T. Saito and K. Hayashi, “Spectral responsivity measurements of photoconductive diamond detectors in the vacuum ultraviolet region distinguishing between internal photocurrent and photoemission current”, Appl. Phys. Lett. , 86, 122113-1-3 (2005).
  20. T. Saito, K. Hayashi, H. Ishihara and I. Saito, “Characterization of temporal response, spectral responsivity and its spatial uniformity in photoconductive diamond detectors”, Diamond & Related Materials, 14, 1984-1987 (2005).
  21. T. Saito, “Difference in the photocurrent of semiconductor photodiodes depending on the polarity of current measurement through a contribution from the photoemission current”, Metrologia, 40, S159-S162 (2003).
  22. Mathias Richter, Udo Kroth, Alexander Gottwald, Christopher Gerth, Kai Tiedtke, Terubumi Saito, Ivan Tassy, Klaus Vogler, “Metrology of Pulsed Radiation for 157-NM Lithography”, Applied Optics-OT, 41, 7167-7172 (2002).
  23. T. Saito and H. Onuki, “Difference in Silicon Photodiode Response between Collimated and Divergent Beams”, Metrologia, 37, 493-496 (2000).